By Rigaku
TMA Analytical devices that detect changes in the shape of a sample when the sample is heated or cooled
Semiconductor Metrology Tools X-ray metrology solutions from lab to fab WDXRF Flexible elemental analysis for thin films XRR, EDXRF & Optical X-ray and hybrid metrology solutions for blanket and patterned wafers TXRF Wafer surface contamination metrology HRXRD X-ray metrology for epitaxial films XRT Non-destructive dislocation imaging XRD X-ray diffraction for crystallographic orientation of wafers and ingots CDSAXS X-ray critical dimension metrology
CATEGORY
Components X-ray sources, detectors, optics, magnetic fluid feedthroughs, and high-voltage supplies X-ray sources High-brilliance X-ray sources Optics X-ray and ultraviolet multilayer and crystalline optics Detectors Research-grade X-ray detectors Magnetic Fluid Feedthroughs Magnetic fluid feedthrough components Miniature X-ray sources and high-voltage systems Enabling small and powerful portable and handheld systems
CATEGORY
Miniature X-ray sources and high-voltage systems Enabling small and powerful portable and handheld systems
CATEGORY
