Measure with nanometer resolution on nearly all materials Resolution: down to 1 nm Speed: up to 70,000 datapoints /sec Optional Feature: Internal Reference to switch between thickness and height mode Available Models Sensor Controllers Sensor Controller Wavelength Smallest thickness in air Largest thickness in air Frequency Axial resolution IT 400 1310 29 µm 3200 µm 70 kHz 1 nm IT 500 1310 38 µm 4300 µm 70 kHz 1 nm IT RW 500 1550 44 µm 4900 µm 70 kHz 1.5 nm IT 1000 1310 66 µm 7500 µm 70 kHz 2 nm IT 1300 1310 87 µm 10500 µm 70 kHz 3 nm IT 1700 1310 114 µm 12600 µm 70 kHz 4 nm IT RW 1000 1550 57 µm 6400 µm 70 kHz 2 nm IT DW 250 1020 15 µm 1800 µm 70 kHz 1 nm IT DW 500 1020 29 µm 3100 µm 70 kHz 1 nm IT DW 1000 1120 66 µm 7500 µm 70 kHz 2 nm IT HDW 250 1020 15 µm 1800 µm 4 kHz 1 nm IT HDW 500 1070 29 µm 3100 µm 4 kHz 1 nm IT HTW 900 – 1200 (Halogen) 4 µm 300 µm 4 kHz 1 nm IT LR 880 16 µm 2600 µm 66 kHz 1 nm Sensor Heads Sensor Head Measuring Head 1a Measuring head 1b Measuring head 2 LWD Sensor Controller IT HTW IT LR IT IT RW IT (H)DW IT IT RW IT (H)DW IT HTW IT LR Working distance [mm] 40 mm 40 mm 40 mm 40 mm 40 mm 100 mm 100 mm 100 mm 100 mm 100 mm Lateral resolution [µm] 30 µm 3 µm 5,5 µm 6,2 µm 3,7 µm 14 µm 16 µm 9,3 µm 75 µm 7,5 µm Numerical aperture 0.1 (90° +/- 5°) 0.1 (90° +/- 5°) 0.045 (90° +/- 2°) Working Principle This advanced measurement technology offers precise distance measurements using a polychromatic light source. Sensors White light or infrared sensors are used for measurement. Reflection Polychromatic light is projected on the material surface, and light is reflected at each layer. Phase Different path lengths cause a phase shift, which varies with the wavelength. Thickness A Fourier Transform of the pattern reveals the optical length, and dividing it by the refractive index gives the thickness. Reliability This technology outperforms conventional laser-based triangulation methods, offering greater reliability across various environments.
Resolution: down to 50 nm Speed: up to 36 million datapoints /sec Features: Interchangeable sensor heads Linesensor 2 Measuring rate: 7.9 – 18.3 kHz Light source: Laser Diodes Measurement points per line: 1200 Sensor head Measuring Range Working distance Axial Resolution Measurement angle Line length Pitch L-CHR2 600 680 µm 9.2 mm 50 nm +/- 50° 2.36 mm 1.97 µm L-CHR2 2500 2500 µm 27 mm 200 nm +/- 33° 4.40 mm 3.69 µm L-CHR2 10000 10600 µm 36.6 mm 800 nm +/- 13° 11.9 mm 9.90 µm Linesensor 2 Pro Measuring rate: 7.9 – 36 kHz Light source: Laser Diodes Measurement points per line: 1200 Sensor head Measuring Range Working distance Axial Resolution Measurement angle Line length Pitch L-CHR2 1250 Pro 1250 µm 13 mm 100 nm +/- 45° 4.50 mm 3.75 µm L-CHR2 2400 Pro 2400 µm 21.4 mm 200 nm +/- 38° 8 mm 6.67 µm L-CHR2 3000 Pro 3000 µm 40 mm 250 nm +/- 15° 20 mm 16.67 µm L-CHR2 5000 Pro 5000 µm 42 mm 400 nm +/- 25° 11.9 mm 9.92 µm
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For high-resolution lateral measurements Resolution: up to 235 MP Speed: up to 72 fps Available Models Camera Type Camera Type Color Native Resolution Maximum Resolution (Pixel Shift) Frame Rate 235M Monochrome 5120 x 5120 15360 x 15360 px 72 fps (8 fps for maximum resolution) 235C RGB 5120 x 5120 5120 x 5120 px (True Color) 72 fps (8 fps for true color mode) Objective Objecive Working Distance Magnification Field of View Aperture Lateral Resolution Xenon-Sapphire 110 mm -1.53 15 x 15 mm² 0.09 0.98 – 2.9 µm Working Principle This advanced measurement technology offers precise distance measurements using a polychromatic light source. Pixel Shifting Pixel shifting boosts resolution beyond sensor limits by capturing multiple shifted images. High Resolution The VWC-235M achieves 235 MP in black and white, while the VWC-235C captures high-resolution color by recording separate RGB values for each pixel.
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Production software for a fully automated metrology process. Management for Metrology Systems. M-Link is our software for controlling handling and multiple metrology systems. Operator-friendly and easily integrated into production environments through SECS/GEM. Key Features: Overview at a glance - Get a real-time view on handling, systems, magazines, measurements and results. Touch screen optimized - Full touch control designed for cleanroom environments. Production ready - SECS/GEM integration for seamless connection to your production environment. ASCAN remote control - Use M-Link to control ASCAN automation software, optimized for full-scale production environments.
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High-Throughput Wafer Metrology Measurement and Analysis Modes Fully Automated including Handling Measurement Area up to 2x 250 x 250 mm² single or double-sided Use-Case Examples Step Height, Flatness (Bow, Warpage), Coplanarity (Bumps, Plugs), Thin Film, Lasermarks and many more Fully Automated Metrology Cell The AL 200D integrates two dockable CT 300 or CT 350T units with a wafer handling system, supporting wafers from 4” to 8”. This design maximizes throughput and can be used for a wide range of front-end applications.
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