Yes, Team Nanotec has the ability to built almost any cantilever shape. Please contact us with your detailed request. Currently our standard cantilevers can be ordered with a maximum stiffness of 750 N/m. Besides that, Team Nanotec allready fabricated cantilevers with stiffnesses as high as 1000 N/m. You are welcome to contact us with your special request. The resonant frequency of a cantilever made by Team Nanotec GmbH with a stiffness of 40 N/m is about 300 kHz. The following table gives you a overview of standard cantilevers available from Team Nanotec GmbH. Available Cantilevers: C = 0.2 N/m, fo = 15 kHz C = 0.7 N/m, fo = 45 kHz C = 3.0 N/m, fo = 75 kHz C = 40 N/m, fo = 300 kHz C = 250 N/m, fo = 575 kHz C = 750 N/m, fo = 830 kHz
Aspire™ AFM probes are conically-shaped AFM tips for general purpose usage. Made of high quality single crystal silicon, the Aspire probes are robust and offer long imaging life. Probe geometry plays an important role when imaging surfaces. Uniform tip shapes guarantee the acquisition of symmetrical images.
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We offer a wide variety of scanning force microscopy probe tips for imaging, metrology, and material characterization, to name only a few. Beside our standard products, we develop and manufacture customer specific cantilevers and probe tips.
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For quantitave 3D AFM the precise tip shape of the AFM - probe needs to be known. For the characterization of probe tips we offer a variaty of probe tip characterizers. A typicall application example is scanning an I²FSR with a CDR - probe to determine the shape of the probe.
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