A single-tilt holder for cryo transfer and screening of thin-film frozen-hydrated/vitrified specimens contained in cartridges used in the latest generation of transmission electron microscopes with auto-loading systems. Understanding specimen quality is a critical aspect of cryo-EM. Due to inconsistencies in sample preparation methods, specimens can often be crystalline, which prevents meaningful data collection. In advanced TEMs, multiple specimens are loaded and then individually imaged and analyzed, often in an unattended mode. When the quality of the specimen is less than ideal, valuable time is wasted generating meaningless data. The Model 2552 Cryo Cartridge Specimen Holder is an advanced single-tilt holder that enables the use of a standard TEM to assess specimen quality. Specimens of sufficient quality can then be loaded into an advanced TEM for data collection. A key characteristic of the Cryo Cartridge Specimen Holder is that it maintains cryogenic temperatures during “reverse transfer.” That is, after the specimen has been imaged in the TEM, the specimen is maintained at cryo temperature during the return to the cryo workstation for subsequent loading into the specimen grid cartridge. The holder includes: a Model 9010 Vacuum Storage Container, an anti-boiling tool, a specimen loading tool, and Viton tubing. The cryo workstation and the temperature controller are purchased separately. For evacuating the holder during zeolite regeneration, Fischione Instruments recommends the Model 9030 Turbo Pumping Station. Prior to freezing thin films, TEM carbon support grids should be cleaned to remove hydrocarbons and to make the grids’ surface hydrophilic. Fischione Instruments recommends that you clean the support grids with the Model 1020 Plasma Cleaner or Model 1070 NanoClean. The Model 2552 Cryo Cartridge Specimen Holder is available for JEOL Ltd.microscopes.
Includes all the components required to produce high quality cross-section specimens for transmission electron microscopy. Widely used cross-section specimens include semiconductor devices (which often have multiple layers and, thus, multiple interfaces), specimens with thin film layers, and composite materials. For the study of interfaces by transmission electron microscopy, it is critical to align the interface of interest parallel to the incident electron beam. One method for preparing such samples is to fabricate cross-section specimens. - Stacks and holds cross-section specimens - Aligns areas and interface of interest - Produces consistent glue layer thickness - Resulting stacks are readily cut by the Model 170 Ultrasonic Disk Cutter - Fabricate self-supported 3 mm diameter disk specimens
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Specimen Grinder. Mechanically prethins specimens for transmission electron microscopy. Produces uniform thickness specimens with parallel sides. Greatly reduces the time spent during the final preparation process of ion beam milling. For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The disk can be mechanically ground using the Model 160 Specimen Grinder to a precisely controlled thickness. Use the Model 200 Dimpling Grinder for final thinning. - Accurate and dependable - Precisely controlled - Specimens up to 18 mm diameter - No additional force needed - Large diameter provides excellent stability - Platen transferable to the Model 200 Dimpling Grinder
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Ultra-Narrow Gap Tomography Holder. A holder capable of tilting up to 90° while providing a maximized field of view for transmission electron microscopy. The Model 2030 Ultra-Narrow Gap Tomography Holder is capable of tilting up to 90° while providing a maximized field of view. The holder is suitable for ultra-narrow gap (< 3 mm) pole-piece geometries. The Ultra-Narrow Gap Tomography Holder accepts a 1.5 mm square or round TEM specimen or grid into a cartridge, securing it with a single clamp. Items included are a specimen loading stand, a Model 9010 Vacuum Storage Container, a loading fixture, a clamp tightening tool, copper grids, tweezers, and a spare parts kit. The holder: - Specimen loading station allows easy positioning and clamping of the specimen into the cartridge - Has a streamlined specimen clamping mechanism eliminates the shadowing associated with most holders at high-tilt angles - Has a retractable clamp that evenly distributes force on the specimen - Accommodates specimen thicknesses up to 100 μm - Is compatible with the TEM’s touch alarm, which stops goniometer movement in the event that a pole touch occurs The holder is available for both JEOL and Thermo Fisher Scientific microscopes.
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Produces high quality disk specimens from thin metal foils. A precision ground punch and die plate eliminate specimen stress and distortion. An ideal accessory to the Model 110 Automatic Twin-Jet Electropolisher. The specimen punch is available with a standard base or with a wide base, which provides extra stability when producing thin foils. A precision ground punch and die plate eliminate specimen stress and distortion of the disk specimen. A spring-loaded return plunger keeps the disk specimen on the die plate surface for convenient handling. Available in standard sizes of 1 mm, 2.3 mm, and 3.0 mm; other sizes available upon request
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