Advanced FIB-SEM for Insight and Impact Tescan FIB-SEM systems combine fast, precise milling with high-resolution imaging and advanced automation. Choose from Ga or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.
Fast, Precise Ex Situ Lift-Out with Tescan EXLO™ Tescan EXLO™ is designed for laboratories where TEM throughput, reproducibility, and cost efficiency matter. By moving specimen lift-out outside the FIB-SEM, EXLO™ keeps valuable beam time focused on milling, while parallelizing lamella transfer and grid mounting. The result: higher output, lower cost per specimen, and a more efficient workflow.
CATEGORY
Nanoscale Insights with Tescan TENSOR™ Analytical STEM Tescan's TENSOR™ is the first 4D-STEM platform built for intuitive multimodal nanocharacterization, combining structural, morphological, and chemical insights in every scan. Real-time data processing, automation, and scripting support make it ideal for both routine and advanced research
CATEGORY
SEM Platforms for Clear, Reproducible Insight Tescan’s SEM platforms provide high-resolution imaging and surface analysis with exceptional contrast, detail, and ease of use—ideal for materials research, quality control, and analytical applications.
CATEGORY
High-Precision Systems for Ion Implantation and UHV Research Tescan’s advanced systems support operation under demanding conditions-from controlled ion implantation to analytical tasks performed in ultra-high vacuum environments-while offering the freedom to customize system configuration and workflows to your specific research needs.
CATEGORY
