Bioweb™ PTFE/PU composite membranes provide an efficient adhesion platform for stents and scaffolds, enabling low-profile encapsulation over nitinol frames without sutures at a much lower temperature (266 °F / 130 °C) than traditional ePTFE coverings (572 °F / 300 °C). In addition to lower temperature bonding than ePTFE, Bioweb™’s PU layer combined with the PTFE layer provides isotropic mechanical properties, allowing Bioweb™ to encapsulate a wider variety of frames and unique geometries. As an electrospun product, Bioweb™ possesses excellent isotropic mechanical properties. The electrospinning process produces a composite matrix with microporous qualities similar to that of ePTFE. However, the pores seen in the outer layer of PTFE in Bioweb™ are typically larger (3-5 μm) before sealing, resulting in potentially improved endothelialization when compared to pure ePTFE coverings. As a global leader in the development and production of advanced medical device components, Zeus provides a wide array of resources, including an extensive network of field application engineers (FAEs), to assist you in bringing your new technologies to the market. Our team will work with you to evaluate your frame structures, confirm our ability to encapsulate them with prototype samples of Bioweb™, and before commercialization, guide you through a fast and easy technology transfer agreement enabling you to cover your own stents or other implantable devices with Bioweb™.

Fresnel zone plates are diffractive optics used for focusing extreme ultraviolet (EUV) and X-ray radiation. These components are fabricated with outer zone width resolutions as fine as 18 nm for soft X-rays and 30 nm for hard X-rays. They are critical components in synchrotron-based microscopy techniques such as STXM (Scanning Transmission X-ray Microscopy) and TXM (Transmission X-ray Microscopy), as well as in ptychography and phase contrast imaging. Custom options are available, including different materials (Au, Cu, Ni, W, Pt), the addition of central stops to block zero-order diffraction, and custom frame sizes.

Custom diffraction gratings and calibration standards are fabricated using high-resolution electron beam lithography (EBL). These gratings feature structures at the nanometer scale, including 1D gratings with a 278 nm pitch (3600 lines/mm) and 2D gratings with a 463 nm pitch. The components are designed for calibrating high-magnification imaging systems like Atomic Force Microscopes (AFMs) and Scanning Electron Microscopes (SEMs), and for use in spectroscopy and other nanophotonics applications. They are available on various substrates, including silicon and fused silica.

Indium Corporation's NanoFoil® is a reactive multilayer foil used for bonding and joining applications. It is composed of thousands of alternating, nanoscale layers of aluminum (Al) and nickel (Ni). When activated by a small, localized energy source such as a laser, electrical spark, or heat, the foil undergoes a rapid, self-sustaining exothermic reaction. This reaction releases a significant amount of thermal energy in milliseconds, melting an adjacent solder layer to create a strong, uniform bond between two components without heating the entire assembly. This technology is ideal for joining heat-sensitive components or for applications in thermally challenging environments where traditional soldering methods like reflow ovens are not feasible.

The Minus K CT-2 is an ultra-thin, low-profile, passive vibration isolation platform. It employs Minus K's patented Negative-Stiffness mechanical technology to isolate sensitive equipment from low-frequency vibrations without the need for air or electricity. This compact design is engineered to support a wide range of payloads while providing significant vibration damping. The CT-2 is specifically designed to create a stable environment for high-resolution instruments that are susceptible to environmental vibrations, such as atomic force microscopes (AFMs), scanning probe microscopes (SPMs), profilometers, and other sensitive metrology tools used in nanotechnology and materials science.

The Minus K CT-10 is a passive, ultra-thin, low-height vibration isolation platform. It utilizes the company's patented Negative-Stiffness technology to provide a compact solution for isolating sensitive instruments from environmental vibrations. The platform is designed to support heavy payloads while maintaining a very low profile. It is a mechanical, passive system, meaning it does not require air or electricity to function. The primary application of the CT-10 is to provide a stable working surface for vibration-sensitive equipment such as atomic force microscopes (AFMs), scanning probe microscopes (SPMs), and other nanoscale metrology and imaging instruments.

The TSI Engine Exhaust Particle Measurement System (EEPMS) 3095 is a specialized spectrometer designed for the real-time measurement of particle size distributions from vehicle and engine exhaust. The system is built upon the Fast Mobility Particle Sizer (FMPS) technology, enabling it to measure the entire particle size spectrum simultaneously with a one-second time resolution. This makes it ideal for capturing transient events, such as changes during engine start-up or acceleration. The EEPMS 3095 can measure solid and non-volatile particles in the size range of 5.6 to 560 nanometers. Its primary applications are in engine research and development, after-treatment (e.g., diesel particulate filter) testing, and regulatory compliance checks.

The TSI Fast Mobility Particle Sizer (FMPS) Spectrometer, model 3091, is an instrument designed for real-time measurement of nanoparticle size distributions. Unlike the Scanning Mobility Particle Sizer (SMPS) which scans through voltages sequentially, the FMPS uses a different electrical mobility measurement technique with multiple electrometers to measure the entire particle size spectrum simultaneously. This allows for a much faster measurement time, providing a full size distribution in as little as one second. The instrument measures particles in the size range from 5.6 to 560 nanometers. It is particularly useful for applications where particle concentrations and size distributions change rapidly, such as engine exhaust measurements, atmospheric process studies, and monitoring of nanoparticle synthesis.

The TSI Scanning Mobility Particle Sizer (SMPS) Spectrometer, model 3938, is a high-resolution instrument designed to measure the size distribution of airborne submicrometer and nanoparticles. The system works by size-selecting particles based on their electrical mobility using a Differential Mobility Analyzer (DMA) and then counting the size-selected particles with a Condensation Particle Counter (CPC). By scanning through a range of voltages, it generates a full particle size distribution. The SMPS 3938 series can measure particles in the range from 2.5 nanometers to 1000 nanometers (1 µm), making it a standard tool for nanoparticle characterization in various fields, including atmospheric research, air quality monitoring, nanotechnology research, and combustion studies.

The TSI Model 3789 is a water-based Condensation Particle Counter (CPC) designed for detecting and counting airborne nanoparticles. It uses distilled water as a safe and environmentally friendly working fluid. The instrument operates by growing nanoparticles to a size where they can be optically detected and counted. A key feature of this model is its high sensitivity, with a user-selectable minimum detectable particle size (50% counting efficiency) down to 2.2 nanometers. Its applications include nanotechnology research, process monitoring in semiconductor manufacturing, particle formation and growth studies, and air quality monitoring.

The MICROCAM is the core interferometer unit that powers Novacam's 3D metrology systems. It functions as the light source (1310 nm infrared) and signal processing unit for the various fiber-optic probes offered by the company. It utilizes low-coherence interferometry to enable high-speed, micron-precision 3D measurements of surface topography and material thickness. The unit itself is a 4U rack-mountable enclosure that integrates with other components to form a complete profilometer system.

The Infinitesima Rapid Probe Microscope (RPM) is a modular scanning probe microscopy (SPM) system. It is designed for integration into other, larger systems ("host tools"), such as e-beam mask repair systems or wafer metrology platforms, for operation in either air or vacuum. The RPM is intended to provide hybrid metrology capabilities by combining its scanning probe technology with the host system's technology (e.g., e-beam). Its first commercial implementation is within the Zeiss MeRiT® neXT mask repair system.

The Infinitesima Metron3D is an automated Atomic Force Microscopy (AFM) system designed for high-volume manufacturing (HVM) process control in the semiconductor industry. It is engineered for high-throughput, in-line metrology of nanoscale structures on wafers, with a capacity of up to 170 wafers per hour. The system integrates advanced features such as a large, automatically exchangeable probe library and 3-axis interferometry for sub-nanometer precision. Its primary applications include characterizing EUV resists, analyzing CMP (Chemical-Mechanical Planarization) performance, and metrology for the front-end-of-line (FEOL) in logic device fabrication.

The Kibron Force Sensor KBN-325 is a core component used in Kibron's MicroTrough systems. It is a high-precision sensor that uses an optical detection system to measure the force exerted on a quartz spring. This digital sensor is designed for high sensitivity and repeatability in force measurements and connects via USB. It is an essential component for instruments that perform surface and interfacial tension analysis.

The Kibron Delta-Pi-4 is a four-channel Langmuir-tensiometer. It is designed for higher throughput studies in surface chemistry and biology compared to the single-channel Delta-Pi. The instrument allows for the simultaneous measurement of surface tension in four parallel wells, making it efficient for studying the binding and interaction of drugs, peptides, and proteins with lipid monolayers. Like the single-channel version, it is used to create and analyze Langmuir films, which serve as models for biological membranes, and it can operate with small subphase volumes to conserve valuable samples.

The Kibron Delta-Pi is a single-channel Langmuir-tensiometer. This instrument is designed for research in surface chemistry and biology, allowing for the precise measurement of surface tension and the study of molecular interactions at the air-water interface. It is specifically used to investigate the binding of molecules like drugs, peptides, and proteins to lipid monolayers, which serve as models for cell membranes. The system uses a sensitive wire probe (DyneProbe) and can work with very small sample volumes (as low as 150 microliters), making it suitable for research with valuable or scarce materials. It is a tool for creating and characterizing Langmuir films.

High quality imaging every time with our pack of 10 general purpose AC mode silicon AFM probes with a high aspect ratio tip. Ideal for deep trench imaging with non-contact/soft tapping and force modulation modes in air, on softer samples. Available uncoated or with an aluminium or gold reflective backside coating. We also offer SEM images of each individual tip.

Get high quality images every time with our pack of 10 general purpose AC mode silicon AFM probes, suitable for non-contact/soft tapping and force modulation modes in air, on softer samples. Available uncoated or with an aluminium or gold reflective backside coating.

Get high quality images every time with our pack of 10 AC mode silicon AFM probes with a high aspect ratio tip. Ideal for deep trench imaging with non-contact/tapping modes in air, on hard samples and stable softer samples. Available uncoated or with an aluminium or gold reflective backside coating. We also offer SEM images of each individual tip.

Bestseller. Get high quality images every time with our pack of 10 general purpose AC mode silicon AFM probes, suitable for non-contact/tapping modes in air, on hard samples and stable softer samples. Available uncoated or with an aluminium or gold reflective backside coating. We also offer SEM images of each individual tip Spring constant: 42 N/m