SR200 - Gate scanner for SR250 and SR255
Stanford Research Systems
The SR200 Gate Scanner module is designed to automate waveform recovery with the SR250 and SR255 Gated Integrator modules. Waveform recovery is done by slowly scanning the gate of the integrator over the waveform of interest. Both the SR250 and SR255 modules have external gate delay control inputs. The SR200 provides an adjustable ramp voltage needed to scan the gates using these inputs.