By UMC
Testing Solution Development - Excellent and Diverse Experience in Program Development - Professional Hardware Design and Probe Card Making - Work with Customers for Cost Effective Test Solution Development Volume Production - Quick Silicon Validation for Fast Yield Feedback - Proactive Customized Test / Alert Report for Yield Monitor - Production Yield Monitoring and Improvement by Bin Limit Control Mechanism Customized Service - Remote Access Tester to Expedite Validation - Testing Sequence, Probing & Cleaning Recipe Optimization - Product Characterization by Corner Wafers
