By CIC nanoGUNE
What we can offer: - Characterization of surface elemental composition with energy dispersive x-ray spectroscopy (EDX) technique, high-resolution backscatter electron imaging (BSE) for elemental contrast. - Mapping of elements distribution on the surface, analysis of elements concentration profiles from surface to the bulk. Possibility to: - Surface or cross-section chemical composition, distribution of elements and phases, quantitative and qualitative analysis of elements from Be to U. Interesting for: Materials science, microelectronics and semiconductors, automotive, laboratory test facilities, microscopy laboratories, machine-tool manufacturers, iron and steel industry, energy storage and solar-energy materials industry, objects of cultural heritage examination, energy and petrochemical companies. Tools: Dual-beam FIB/SEM (Focused Ion Beam and Induced deposition); Scanning electron Microscopy (SEM)/(ESEM)
