By temicon
For optical and topographical characterization of surfaces, we use optical microscopy, high-resolution scanning electron and atomic force microscopy optical and mechanical profilometers. Structure sizes and geometries can be measured with high precision by the instruments we use for coating masters, shims, sleeves, films and components. An automated microscopy measuring station allows scanning of structure surfaces and characterization of structure features and defects. An in-line inspection system in our UV imprint roll-to-roll production lines measures the layer thickness and detects defects to check and document production quality. characterization function of surface characterization optical properties characterization topographical properties Measuring station for optical measurement of microstructures Parameter check of a microlens array (MLA)
