Queensgate closed-loop velocity control enables fast AFM, capturing high-quality, high resolution, imagery at raster speeds of up to 4 mm/s over larger scan areas. Scan areas of 100×100 μm to 600 x600 μm can accommodate larger samples and payloads. In addition the linearity of the position data allows high quality images to be captured without requiring complex post-processing techniques to remove piezo distortion or stitching effects. Queensgate high performance piezoelectric stages are used in the specimen scanner of an AFM to provide sub-nanometer spatial resolution. Dynamic performance is also important as the faster the Z dimension can adjust to the sample’s topography, the quicker the surface can be scanned in the X and Y axis. Speed is essential as it reduces measurement times and possible temperature drift.
