By Wintech Nano-Technology Services Pte. Ltd.
1. Project introduction: EDX is the determination of the elements contained in the sample by analyzing the X-ray wavelength and intensity of the elements emitted by the sample, and the relative content of the elements according to the intensity. Talos Dual-X SDD: 2 EDX probes for fast imaging and high resolution. The Dual-X's EDX collection is more efficient EDS system Super-X Dual-X Full solid angle 0.9 srad 2.56 srad Effective solid angle*0.9 srad 1.65 srad Detectors 4 SDD, built-in design 2 large SDD, retractable design 2. Application advantages: Examples of large-area, high-resolution HAADF STEM and EDS drawings using the "Dual-X" detector. Sample: Gold-nickel nanoparticles, collection time< 1min.
