NW
Structural & Compositional AnalysisCharacterization & Testing

Characterisation

By Melbourne Centre for Nanofabrication

Atomic force microscope (Dimension iCon AFM) Bio atomic force microscope (Nanowizard II Bio AFM) FIB-SEM (FEI Helios Nanolab 600 Dual FIB-SEM) FEG-SEM (FEI NovaNano SEM 430) Tabletop SEM (Hitachi) Spectroscopic ellipsometer (J.A. Woollam M-2000DI) Laser doppler vibrometer (Polytec MSA-400 and UHF-120) Profilometer (Ambios Xp200) Optical profilometer (Bruker Contour GT-I) Light microspectrometer (Nikon Ti-U) Zeta sizer (Malvern Zetasizer Nano ZS) UV/VIS spectrophotometer (Agilent Cary) Zeta potential analyser (Anton Paar SurPASS) Laser scanning confocal microscope (Nikon A1Rsi) Laser scanning confocal microscope (Leica Stellaris 5) Laser TIRF system (Nikon TIRF with Ti-U) Hyperspectral imaging (Cytoviva) Scanning ion conductance microscope (ICnanoS2) Microwave probe station (Signatone WL-1160) Filmetrics Suite (Filmetrics F20, Filmetrics F40, Filmetrics F50)