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Structural & Compositional AnalysisCharacterization & Testing

Semiconductor Characterisation

By Edinburgh Instruments

Characterising Structure and Carrier Dynamics in Semiconductors Semiconductor research relies on optical techniques that probe structure and electronic behaviour. Raman microscopy assesses crystal quality and strain, while photoluminescence and transient absorption quantify defect states and carrier dynamics. Together, these approaches reveal the processes governing material performance in real devices.