By Nanosurf AG
For sub-nm Surface characterization of highly polished concave and convex glass, large optics, for production-scale QC, and R&D, Nanosurf offers the unique service of engineering bespoke AFM systems configured specifically to your unique application and performance requirements. Thanks to years of experience designing solutions for complex measurement situations, we have a large selection of component solutions to apply to your system. Our engineering and development team will work with your team to understand your needs and iteratively design an AFM system for your individual application. High-performance AFM Mountable versions of Nanosurf’s research-grade scan heads FlexAFM and DriveAFM provide high-performance measurements to determine roughness and critical dimensions. Nanosurf's tip scanner technology allows our scan heads to be easily mounted, preserving the scanner performance when investigating heavy samples. 5 Degrees of Freedom We design the sample stage, scan head mount, and geometry of the AFM system based on your sample and measurement requirements, regardless of size, weight, and curvature. With up to 5 axes of freedom, our sample stages allow measuring any position on your sample. - Virtually no restrictions to sample weight, size, and geometry - High repositioning accuracy - Highly reproducible results System Optimization Usually AFM is highly sensitive to environmental perturbances like acoustic noise, temperature variations and floor vibrations. By building detailed models of your system and running performance simulations that include environmental factors, we are able to ensure all your requirements are met by the final system upon delivery. Automation For factory-scale process integration, we offer automation solutions that go beyond simple measurement series. Talk to our automation experts to see what is possible with MES. Cleanroom Compliance Where precision is paramount, so is cleanliness. For applications like those found in areas such as the semiconductor industry, we design our systems to fulfill the most stringent cleanliness requirements: all materials and components are cleanroom certified, and assembly is carried out in a clean environment. Safety and Reliability All of our systems can be equipped with a programmable logic controller (PLC) that ensures safe operation for your employees and your samples. If one of the system security conditions is triggered, e.g. safe limited speed (SLS) is exceeded, the emergency-stop button is pressed or an AFM cantilever is lost, the PLC executes a safe torque off (STO). Features Large Selection of Operating Modes Safe and Reliable Closed Loop Motion Control 5 Degrees of Freedom ISO 6 Cleanroom Compliant Tiltable Scan Head Automation Air-Bearing-Based Sample Translation Fully Customizable Operating Modes Standard imaging modes - Static Force Mode - Lateral Force Mode - Dynamic Force Mode (Tapping Mode) - Phase Imaging Mode Mechanical properties - Force Spectroscopy - Force Modulation - Force Mapping (Stiffness and Modulus, Adhesion) Electrical properties - Conductive AFM (C-AFM) - Scanning Spreading Resistance Microscopy (SSRM) - Piezoelectric Force Microscopy (PFM) - Electrostatic Force Microscopy (EFM) - Kelvin Probe Force Microscopy (KPFM) - Scanning Microwave Microscopy (SMM) - Magnetic Force Microscopy (MFM) Software Nanosurf's industrial AFM systems are run by our standard C3000/CX control software, which is well known for its ease of use and flexibility. Through the scripting interface even complex automation tasks can be realized by skilled end-users or our software engineering team - from small measurement automation series to full-scale MES integration.
