By CIC nanoGUNE
What we can offer: Multiscale surface morphology analysis for different types of materials, measurements of peculiarities down to nanometer size, imaging of non-conductive materials without any special sample preparation technique, wet samples, morphology evolution during in-situ heating/cooling/indentation, grain-size distribution. Possibility to: - Surface morphology and topography, measuring of characteristic sizes of nanostructures, grains, defects, pores, fracture surface analysis… Interesting for: Materials science, microelectronics and semiconductors, automotive, laboratory test facilities, microscopy laboratories, machine-tool manufacturers, iron and steel industry, energy storage and solar energy materials industry, objects of cultural heritage examination, energy and petrochemical companies. Tools: Scanning electron Microscopy (SEM)/(ESEM); High-resolution Transmission Electron Microscope (HRTEM)
