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Surface & Interface AnalysisCharacterization & Testing

Modifications of Scanning Probe Microscopy

By NanoCraft Inc.

Besides CFM, NanoCraft Coating GmbH offers further modifications of scanning probe microscopy (SPM). These include: - Atomic force microscopy (scanning force microscopy, AFM) - Piezoelectric force microscopy (PFM) - Digital Pulsed Force Mode (DPFM) – SPM - Tapping Mode Microscopy