By Gatan
Delivers high-resolution, non-destructive elemental analysis for diverse materials—ideal for layered, sensitive, or irregular samples. Micro x-ray fluorescence (micro-XRF) is a non-destructive analytical technique that provides spatially resolved elemental analysis of a wide range of materials. By focusing an x-ray beam to a small spot size, micro-XRF enables high-resolution elemental mapping and quantitative analysis, making it ideal for applications in materials science, forensics, geology, electronics, and cultural heritage. Micro-XRF works by directing a focused x-ray beam onto a sample, which causes the emission of characteristic secondary (fluorescent) x-rays from the elements present. These x-rays are then detected and analyzed to determine the elemental composition of the sample. Unlike traditional XRF, micro-XRF uses polycapillary optics or collimators to focus the beam to a small spot, typically in the range of 10 – 50 µm, allowing for localized analysis and high-resolution elemental mapping. This makes it especially useful for heterogeneous or layered samples. Micro-XRF systems often include motorized stages for scanning, advanced detectors for improved sensitivity, and software for generating elemental distribution maps and quantitative data. Micro-XRF combines the benefits of traditional XRF with spatial resolution, enabling detailed analysis of small features, inclusions, or layered structures. It is particularly valuable for non-destructive testing and analysis of valuable or sensitive samples. - High spatial resolution: Enables localized analysis of small features, inclusions, or defects - Non-destructive analysis: Ideal for valuable, historical, or delicate samples - Broad elemental range: Detects elements from C – Am - Minimal sample prep: Works with solid, powdered, liquid, irregular, or nonconductive samples without extensive preparation - Layered structure analysis: Capable of analyzing coatings, laminates, and multi-layered materials Step 1: Sample preparation - Minimal preparation is required. Samples can be solid, powdered, liquid, or irregular. Flatness is preferred for optimal focus, but not mandatory. Non-conductive samples do not require coating. Step 2: Data collection - The focused x-ray beam scans the sample surface. Fluorescent x-rays are collected by energy dispersive detectors. The system records the intensity and energy of emitted x-rays to identify and quantify elements. Step 3: Analyze - Software generates elemental maps, line scans, and quantitative reports. Users can visualize elemental distributions, detect trace elements, and analyze layered structures.
