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Failure Analysis & DiagnosticsCharacterization & Testing

Dualbeam™ FIB/SEM Analysis and Sample Preparation

By Assurance Technology Corporation

ATC introduced its new Dualbeam™ FIB/SEM capability today, accompanied by a staff with 30 years in FIB/SEM analysis and sample preparation. This new capability enhances the ATC position as a leader in Failure Analysis (FA), Destructive Physical Analysis (DPA), Prohibited Material Analysis (PMA) and Real Time, 3-D, Color X-Ray services.