By Assurance Technology Corporation
Nano-scale fabrication is possible with our DualBeam instrument. It requires a precise, layered application of FIB milling and deposition. With an ongoing drive to improve the quality of fabricated materials and devices, materials researchers increasingly need structural and compositional information at the nano-scale. Our Scios Dual Beam delivers just that, with multi-scale, multi-dimensional insight down to the sub-nanometer range, giving you a thorough look at both the surface and interior of your sample. Not only that but, thanks to the FIB's ability to deposit material as well as remove it, our Dual Beam is equipped to produce functioning prototypes of miniature MEMS and NEMS devices. Our Scios is also routinely used to create some of the highest quality samples for atomic-resolution scanning transmission electron microscopy (STEM) imaging, a technique that allows you to directly observe the fundamental building blocks of your materials and when combined with the unique AutoTEM™ Software for automated in situ lift-out. AutoTEM™ 4 Software: As sample preparation is considered to be one of the most important, but also most challenging and time-consuming, DualBeam use cases, Thermo Fisher Scientific has developed automation software to support complete in situ sample preparation. AutoTEM™ 4 Software enables fast and easy site-specific preparation of high-quality STEM/TEM samples for a large variety of materials. - S/TEM sample preparation. - Robust, predictable results that can be acquired by our experts. Easy Lift Nanomanipulator: Our DualBeam system has the Thermo Scientific EasyLift™ Nanomanipulator that allows you to extract lamellae and attach them to a TEM grid, In-Situ within the DualBeam chamber. Low-drift, high-precision movements for in situ TEM sample lift out. Control of the Easy Lift Nanomanipulator is integrated into the DualBeam user interface. Movement of the probe can be done on screen with the mouse.
