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Surface & Interface AnalysisCharacterization & Testing

AFM Optical Platform

By HORIBA Scientific

Designed to be combined with Optical Spectroscopies The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.