By Monash Centre for Electron Microscopy
Areas of specialist expertise: - Quantitative X-ray Spectroscopy - Electron Back Scatter Diffraction - Examination of a wide range of materials under optimum conditions - FIB (sectioning, in-situ lift-out) - Low Voltage/Low Damage High Resolution Imaging - Cathodoluminescence - Environmental/low vacuum SEM - Monte Carlo modelling of electron interactions and x-ray production - X-ray Ultramicroscopy and Tomography - Ultramicrotomy of hard and composite materials for bulk SEM specimens
