The effectiveness of this approach is evaluated and quantified through Highly Accelerated Lifetime Testing (HALT), using a dedicated aixACCT HALT system integrated with a climate chamber. This enables controlled stress testing of piezoelectric properties, electrical breakdown behaviour, and general device performance under accelerated environmental conditions. Lifetime data from HALT testing is analysed using Weibull statistics and lifetime modelling, providing the quantitative basis for predicting device behaviour at operating conditions. This data informs both process development decisions and the qualification data packages that customers require for product release. “Reliability is something you design into the process from the very beginning,” says Svedin. “If you treat it as a validation step at the end, you’ve already accepted risk you don’t fully understand.” As the devices Silex helps bring to production are often used in medical or industrial applications, failure is simply “not an option,” he adds.
