By NenoVision
With the CPEM technology developed by NenoVision, you can easily acquire AFM and SEM simultaneously and correlate them in real time. The CPEM brings new possibilities for advanced correlative imaging in a variety of fields such as Material Science, Nanostructures, Semiconductors, Life Sciences, and many more. CPEM has been developed for a variety of applications, representing a new patented technology of correlative imaging. It brings a solution synchronizing: - the scanned area - resolution and image distortion - and enables to correlate both acquired AFM and SEM images in a real-time
