NW
Mechanical & Physical TestingCharacterization & Testing

Ultrafast Spectroscopic Imaging Microscopy (FLIM and STED-FLIM)

By Korea Basic Science Institute

Conduct of research on elucidating carrier dynamics such as electrons, holes, excitons, trions, and plasmons in advanced functional photonic materials and on precise control of their properties using ultrafast spectroscopic imaging microscopy with simultaneous time, space, and energy resolution (FLIM and STED-FLIM)