Complete thin film measurement The Aquila nkd is used for a wide range of optical metrology applications including QC and process development. A small selection of application notes are presented here for your interest. If you would like to discuss a particular thin film measurement application, please feel free to contact us. The flexibility of the nkd makes it suitable for measuring the photometric performance, film thickness, refractive indices, absorption and uniformity of amongst others: Ophthalmic lenses• Sunglasses• Flat panel displays • Surface Coatings & Treatments • Precision optics• Semiconductors • Telecoms components • CD & DVD optical systems • Solar control glass and coatings• Automotive lenses • Visors • Packaging materials
