By NanoBrand
Transmission electron microscopy (TEM) measures nanoparticle physical diameter and shape directly from high-resolution images, providing the size used in many material specifications. High-resolution imaging can reveal particle morphology, surface features, and aggregation, while energy-dispersive X-ray spectroscopy (EDS) supports compositional analysis and elemental mapping. TEM images are analyzed to report mean particle size and standard deviation, providing quantitative data for quality control, batch comparison, and product development. TEM can also help assess sample uniformity and particle-size distribution. Combined with DLS, zeta potential, UV-vis spectroscopy, and ICP-MS, TEM characterization provides a detailed view of nanoparticle size, composition, and dispersion quality.
