By Center for Functional Nanomaterials Brookhaven
For photon science and other applications requiring x-ray and charged-particle detection, we developed Si pixel and strip sensors. The Si pixel sensors have been incorporated into the Vertically Integrated Photon Imaging Chip and Hyperspectral Energy X-ray Resolving Imaging Detector, both under development at Brookhaven’s National Synchrotron Light Source II (NSLS-II). The Si strip sensors are supporting x-ray scattering and diffraction experiments at various x-ray synchrotrons, including NSLS-II, the Canadian Light Source, and the Cornell High Energy Synchrotron Source.
