NW
Surface & Interface AnalysisCharacterization & Testing

Bruker FastScan AFM

By Northwestern University - NUANCE Center

High bandwidth enables exceptional force control and high scan rates with closed-loop accuracy to surpass efficiency of any other commercial AFM system 20Hz TappingMode scan rates provide excellent quality images, matching that typically seen at 1Hz and maintaining good quality even at scan rates >100Hz Higher speed ScanAsyst delivers superb quality images at 6Hz and a surveying capability up to a 32Hz scan rate Z-axis tip velocity of 12mm/second in contact mode and velocities of 2.5mm/second in closed-loop while retaining <1% X-Y tracking error make the FastScan the world's most practical fast scanning AFM Automated laser and detector alignment enable quick and optimized setup The system provides the sample navigation tool MIRO with optical resolution to quickly identify and capture nanometer features in minutes.