NW
Surface & Interface AnalysisCharacterization & Testing

J.A. Woollam M2000U Spectroscopic Ellipsometer

By Northwestern University - NUANCE Center

Instrument Details Features - 245-1000nm, 470 wavelengths - Ideal for many thin films: dielectrics, organics, semiconductors, metals, and more. - Measure optical constants and thickness for coatings from subnanometer to tens of microns. - Map thin film uniformity and other properties