By Molecular Analysis Facility (MAF)
Make/Model: Bruker OM-DektakXT Location: MolES G44G Profilometry is a technique used to extract topographical data from a surface. For example it can be used to quantify surface roughness, thickness, and stress properties of materials. Its capabilities are diverse, in which it can measure film thicknesses from sub nanometer to 1 mm with angstrom repeatability. Key Capabilities Measures thickness and roughness of solid samples from nm to mm scale Data Produced - Height vs. length (single measurement) - 3D map of sample surface Compatible Samples Resistant to minimum stylus force (2 mg)
