By Molecular Analysis Facility (MAF)
Make/Model: Bruker Hysitron Location: G44G Bruker's Hysitron nanoindenter utilizes capacitive transducer technology that deliver nN force and sub-angstrom displacement measurement capabilities for unbeaten nanoscale mechanical characterization. This indenter is also capable of SPM Imaging, environmental temperature control, high speed property mapping, scratch tests, and dynamic nanoindentation. The hysitron has many additional components including a high load cell, a heated stage, a conductive stage, and a conductive tip that will allow for a variety of different experimental set ups. The Hysitron can be set up with two different tips at one time, and multiple tip geometries are available upon request including berkovich, flat punch, cube corner, and conical. Key Capabilities - Heating stage allows measurements up to 400 ℃ - Indentation, scratch, and nanoDMA modes available Data Produced Load vs. displacement curves Compatible Samples - Required tip geometry dependent on sample properties. Contact staff to see which tips are available. - Maximum sample height 1 inch - For non-free standing samples, cyanoacrylate based adhesive with sample mount recommended Additional Information - Dynamic nanoindentation - Quasi-Static nanoindentation - Nanoscratch Testing - SPM Imaging - High Speed Property Mapping
