With the wide range of particle characterization methods, having the right measuring device readily available and fully utilized can be challenging. At Particle Metrix, we offer professional sample analysis in our application laboratories, ensuring precise and reliable results. Our comprehensive consulting services complete our offering. We analyze your samples within a measurement range of 0.8 nm to 300 μm, whenever possible at their original concentration. Our expertise could significantly support your research. Put us to the test! We’re happy to discuss your specific requirements and provide an insight into our capabilities. Upon request, we’ll prepare a non-binding offer tailored to your needs.
