By Applied Research & Photonics
ARP provides terahertz nano-scanning material characterization and testing services that helps semiconductor and nano-material researchers and manufacturers, easily visualize and identify using 3-dimensional images, surface and sub-layer defects. Key Features & Benefits • Non-Contact & Non-Destructive Testing • Sub-Surface Layer by Layer Inspection • Sub-Nanometer Resolution • 3-D Imaging • Fast Turnaround Testing
