By Applied Research & Photonics
Applied Reseach & Photonics, Inc. (ARP) provides terahertz nano-scanning material characterization and testing services that helps semiconductor and nanomaterial researchers and manufacturers, easily visualize and identify in 3-Dimensional images, surface, sub-layer defects and failures. ARP testing is non-contact, non-distructive and performed at ambient temperatures. Materials - Semiconductor Wafers - Nanomaterials - Soft materials - Nano-composites Key Features - 3-Dimensional Imaging - Sub-Surface Inspection - Non-Contact - Non-Destructive - Layer-by-Layer Analysis - Material Characterization: Lattice Image, Stacking Fault, Dislocations, Nanovoids, Delamination Fast Turnaround Testing ARP consultants provide a comprehensive test report and assist in interpretation of results. ARP is offering characterization services for just about any semiconductor wafers and nano-system. Quotation is provided on a case by case basis. Examples are available upon request. 1. Nanoscale imaging and quantification: Semiconductor features size; Layers' thickness; Metal lines on wafers 2. Materials characterization: Lattice image; Stacking fault; Dislocations; Nanovoids; Delamination 3. 3D imaging and size of 0D–3D nanomaterials: Quantum dots; Graphene exfoliates; Carbon nanotubes; Nano-alloyes; Polymer-nano composites 4. Layer-by-layer analysis: Any non-metallic system in non-destructive mode. 5. Spectral analysis of both surface and sub-surfaces of materials: Solid, Liquid and Gaseous 6. Collaboration available for new applications.
