By Molecular Analysis Facility (MAF)
Make/Model: Woollam M-2000 Location: MolES G43F Ellipsometry measures the change in polarization of reflected or transmitted light as it interacts with a material and is used for determination of thicknesses and optical parameters of thin films. Key Capabilities - Spectral Range: 210-1700 nm - Scan Speed: < 10 s for collection of entire spectral range Spot Size: Normal > 1.5 mm, Focused <150 µm - Sample mapping 150X150 mm - Sample Alignment: Automated - Imaging: Integrated CCD camera - Heating Option: Room temp to 300 *C Data Produced - Polarization changes as amplitude ratio and phase difference. Proper modeling required for material properties. Compatible Samples Thin Films
