Our extensive opto-electronic measurement capabilities allow you to invest your valuable resources in technology development and leave the testing to us. We offer comprehensive on-wafer, die-level, and packaged-device testing services for both photonic and electronic devices. Capabilities include: - Passive Optical - insertion loss, propagation loss, spectral, group index/velocity - Active Optoelectronic - modulation (Vπ L), detector responsivity, laser LIV - Telecom/Datacom - eye-diagram, optical modulator and photodiode bit error rate testing - RF - S-parameters, detector bandwidth - DC - DC IV, leakage current measurements using a multi-contact DC probes
