By 2d+ Crhea
The scattering of photons by atomic electronic clouds gives X-ray diffraction (XRD) when the arrangement of atoms is ordered in space and that the wavelength of photons is of the order of the interatomic distance. The XRD is so very sensitive to structural defects that disrupt the arrangement of atoms, making it a preferred method for determining the defect density in an epitaxial 1 layer. The XRD depends also the electron density of the atoms and thus allows determine composites of alloys 2. Constraints, the compositions, as well as the disorientations of the different layers of a hetero-structure can be evaluated simultaneously by realizing reciprocal space mapping 3. The thicknesses, roughness and thin film compositions can be determined thanks to X-ray reflectivity 4.
