NW
Structural & Compositional AnalysisCharacterization & Testing

Scanning Electron Microscopy (SEM)

By MVA Scientific Consultants

Scanning electron microscopy (SEM) allows us to examine and characterize particles and nanoparticles, fracture surfaces, surface morphologies, composites and their constituents, and microstructures of prepared cross-sections. The scanning electron microscope is one of the most powerful and useful tools for material analysis; it uses electrons rather than light waves to examine surfaces, permitting much greater magnification, resolving power and depth of field. SEM analysis provides us with high resolution imaging at magnifications up to 300,000X. With the addition of energy dispersive x-ray spectrometry (EDS), we can simultaneously determine the elemental composition and morphology of different materials. Our focus is to offer value and high quality data in a timely manner. Our SEM lab services offer a variety of customized analyses to clients with advanced materials across a wide spectrum of industries and applications, including: - Pharmaceuticals - Medical devices - Cosmetic products - Food manufacturers - Environmental - Semiconductors - Polymers - Coating - Nanoparticles and nanotubes - Glass containers - Minerals - Failure analysis