HD-KFM™ III, single-pass KPFM on the Nano-Observer II, resolves grain-boundary potential contrast in perovskite thin films at sub-10 nm resolution. HD-KFM image (10 µm) of three linear electrodes on a silicon surface, biased at 1 V. The surface potential is homogeneous on the electrodes (dark blue), and the lateral diffusion of the potential around the electrodes (cyan) is resolved. Nano-Observer AFM. HD-KFM™ III maps grain-boundary surface potential in perovskite thin films in a single pass, and repeating the scan on the same area under illumination gives the surface photovoltage. AFM scan of perovskite thin film — HD-KFM™ III surface potential: potential contrast at grain boundaries, resolved in a single pass.
