By LayTec GmbH
Whilst LayTec’s thin film metrology systems can be applied for tandem devices, the quality of the encapsulation of conventional c-Si PV modules can be assessed by LayTec’s X Link® metrology system.. Thin film deposition processes for perovskite top cells in tandem devices can be monitored in-situ and in-line regarding film thickness, bandgap, resistance and charge carrier lifetime For tandem devices the deposition of the respective thin film solar cell deposited on top of the c-Si solar cell can be monitored by LayTec’s thin film metrology methods described in the perovskite section.
