By Oxford Materials Characterisation Service
Atomic Force Microscopy Agilent 5400 AFM - High resolution imaging of surfaces - Scanning range up to 80 µm x 80 µm - Z range of up to 7 µm - Vertical noise of 5 nm RMS - Topography imaging using Contact Mode; TappingMode™ - Surface roughness analysis - Force – distance analysis for local compliance - Capability of imaging a surface dry or under liquid - Lateral Force Microscopy (LFM)
