By Korea Advanced Nano Fab Center (KANC)
Evaluating characteristics of nanomaterials and products Supporting nano structure & surface analysis, Testing samples Measurement/Analysis: AFM II XE100(PSIA); AFM III XE100(PSIA); FE SEM II S-4300SE(Hitachi); PL mapper RPM2000(Accent); Hall Measurement HL5500PC(Accent); Doping profiler ECVpro(Accent); FT-IR Nicolet5700(Thermo electron corp.); XRD D8 DISCOVER(Bruker); CL MONO CL3(GATAN); Spectro Photometer Cary5000(Varian)
