NEWSROOM

Sometimes a change of perspective can make a world of difference. A team of scientists from PETRA III, Centre for X-ray and Nanoscience (CXNS) at DESY, and MAX IV has rearranged the method in which one can use an X-ray beam to image a sample without using high-quality lenses. The method, called ptychography, has been widely used at synchrotrons and free-electron lasers to analyse the inner workings of materials quickly enough while avoiding major damage to the sample by the X

“We now have a way for people to interact with a detector on one side and a supercomputer on the other side with a simple webpage called Distiller in the middle,” said Peter Ercius, interim facility director of the National Center for Electron Microscopy (NCEM) at Berkeley Lab’s Molecular Foundry. “We’re moving towards getting huge amounts of data processed in an automated way with minimal human intervention.”